|
|
|
|
|
|
|
|
|
|
|
|
General
"M" Shaped Gages |
Semiconductor strain gages are devices which
vary in resistance as strain is applied to them. This property makes
them very useful in measuring extremely small amounts of force with
accuracy and precision. Creative uses for these gages have ranged
from the measurement of internal pressures inside solid rocket engines
to delicate medical apparatus used in microsurgery.
Gages made from semiconductor materials have
advantages over more conventional types of strain gages. These include
homogeneity, increased “sensitivity”, and decreased
size. Gages made by Micron Instruments range down to 0.027"
(0.69 mm) in length.
Micron semiconductor strain gages are made
from Czochoralski pulled boron doped bulk silicon. They have no
P/N junction. The silicon is etched to shape, eliminating the potential
for molecular dislocation or cracks, thereby optimizing performance.
All gages manufactured by Micron must pass
through rigorous tests before they are approved for use by our customers.
The behavior of each gage at different temperatures is measured
and the gages are matched to each other based upon these measurements.
Customers may specify matched sets of 2, 4, or more gages, or purchase
unmatched sets of bulk gages.
|
"M" Shaped Semiconductor Strain Gages |
|
|
High Stability, high accuracy, low
cost semiconductor strain gages for all applications. The gages,
made from P-doped silicon, are the heart of the Micron Instruments
pressure and force transducers. |
| |
Schematic |
| |
 |
|
| |
|
|
|
X = Overall Length
Y = Active Area
Z = Width |
| |
Specifications |
Part Number
X Y |
Dim
Z |
Lead Type |
Thickness |
Resistance
@ 78 deg F |
Gage Factor |
TCGF*
|
TCR* |
|
SS-060-040-2500-PM |
0.032" |
Welded |
0.0004" |
2500 ± 150 Ohms |
140 ± 10 |
-13 |
17 |
|
| |
Standard Bridge Matching |
| Temperature °F |
0° |
78° |
278° |
|
| Standard Matching |
±0.6% |
±0.4% |
±0.4% |
Percent of Base Resistance |
|
| |
Semiconductor Strain Gage FAQ'S |
|
|
|